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    电感耦合等离子体质谱法同时测定锌精矿中镓、锗、铟的含量

    Simultaneous Determination of Ga, Ge and In in Zinc Concentrate by Inductively Coupled Plasma Mass Spectrometry

    • 摘要: 为准确快速测定锌精矿样品中镓、锗、铟的含量,提出了提示方法,并在溶样体系、目标元素同位素、内标元素选择以及共存元素、试剂干扰及消除方面进行了探讨。将样品过筛后,用硝酸-氢氟酸-高氯酸体系加热溶样,在所得溶液中滴加25%(体积分数,下同)硫酸溶液后再加入50%(体积分数)硝酸溶液溶解盐类,定容,过滤,根据实际样品中目标元素和共存元素铜含量稀释滤液,供电感耦合等离子体质谱仪分析。结果显示:硝酸-氢氟酸-高氯酸体系可以充分溶解样品,避免了镓和锗挥发损失、硅化合物夹杂、包裹性硫球夹杂的影响;在待测溶液中滴加25%硫酸溶液,能避免了样品中铁形成铁氧化物析出;以内标元素同位素103Rh校正71Ga、74Ge,187Re校正115In,消除了大部分共存元素带来的干扰;以进一步稀释样品溶液消除铜质量分数不小于8%时内标校正带来的偏差;以在线/离线公式校正了74Se对74Ge以及115Sn对115In的干扰。镓、锗、铟标准曲线的线性范围为0.20~50.00 μg·L-1,检出限(3s)为0.002 6~0.010 5μg·g-1。方法用于标准物质和实际样品的分析,标准物质中镓、锗、铟的测定值和认定值基本一致,加标回收率为95.0%~106%,测定值的相对标准偏差(n=11)为2.6%~8.2%。和文献方法进行比对,两种方法的测定值基本一致。

       

      Abstract: In order to accurate and quick determination of Ga, Ge, and In in zinc concentrate samples, the title method was proposed, and the aspects of the selection of sample dissolution system, target element isotope and internal element, as well as the interference and elimination of coexisting element and reagent were discussed. After sieving the sample, the nitric acid-hydrofluoric acid-perchloric acid system was used to dissolve the sample by heating. Then 25% (volume fraction, the same below) sulfuric acid solution was added dropwise to the obtained solution, and 50% (volume fraction) nitric acid solution was added to dissolve the salt. After constant volume and filtration, the filtrate was diluted according to the content of target elements and the coexisting element Cu in the actual sample, and analyzed by inductively coupled plasma mass spectrometer. It was shown that the nitric acid-hydrofluoric acid-perchloric acid system could fully dissolve the sample, avoiding the effects of Ga and Ge volatilization loss, silicon compound inclusion, and encapsulated sulfur ball inclusion. Dropping 25% sulfuric acid solution into the test solution could avoid the formation of iron oxide precipitation from Fe in the sample. Internal standard element isotope 103Rh was used to correct 71Ga and 74Ge, and 187Re was used to correct 115In, eliminating the interference caused by most coexisting elements. Further diluting the sample solution was used for eliminating the correction deviation caused by internal standard correction when the Cu mass fraction was not less than 8%. The interference of 74Se on 74Ge and 115Sn on 115In was corrected using online/offline formulas. Linear ranges of the standard curves of Ga, Ge, and In were in the range of 0.20-50.00 μg·L-1, with detection limits (3s) in the range of 0.002 6-0.010 5 μg·g-1. The proposed method was used for the analysis of reference materials and actual samples, and the determined and certified values of Ga, Ge and In in the reference materials were basically consistent, with recoveries obtained by standard addition method in the range of 95.0%-106%, and RSDs (n=11) of the determined values ranged from 2.6% to 8.2%. The proposed method was compared with literature methods, and the determined values of the 2 methods were basically consistent.

       

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