X射线荧光光谱法测定石膏中11种元素的含量

XRFS Determination of 11 Elements in Gypsum

摘要: 采用X射线荧光光谱法测定石膏中钠、镁、铝、硅、硫、钾、钙、钛、锰、铁、锶等11种元素的含量.样品研磨30 s后压片,样片用于X射线荧光光谱分析.以GBW 03109、GBW 03110、GBW 03111、GBW 03109a、GBW 03111a、GSB 08-1352-2001、GSB 08-1352-2006、GSB 08-1352-2009等8种标准物质为基础制作校准曲线,优化了各元素的基体校正数学模型.各元素的检出限在0.001 4%~0.27%之间.对同一石膏样品平行测定10次,其相对标准偏差(n=10)在0.51%~4.0%之间.方法用于3个石膏样品的分析,所得结果与国家标准方法测定结果相符.

Abstract: XRFS was applied to determine the concentration of 11 elements,i.e. Na,Mg,Al,Si,S,K,Ca,Ti,Mn,Fe and Sr in gypsum. The sample was grinded for 30 s and squashed into disc shaped to be used for XRFS analysis. Calibration curve was prepared with 8 CRM′s of GBW 03109,GBW 03110,GBW 03111,GBW 03109a,GBW 03111a,GSB 08-1352-2001,GSB 08-1352-2006 and GSB 08-1352-2009. The mathematical models of matrix correction of the 11 elements were optimized. Detection limits of the 11 elements were found in the range of 0.001 4%-0.27%. Values of RSD′s (n=10) were found to be in the range of 0.51%-4.0% by analysis of a sample of gypsum. The proposed method was used in analyzing 3 samples of gypsum,giving results in consistency with those obtained by the GB method.