X射线荧光光谱法测定锶铁氧体半成品中铁、锶、硅
XRFS Determination of Iron, Strontium and Silicon in Semi-finished Product of Strontium Ferrite
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摘要: 将样品在玛瑙研钵中与淀粉混合研磨,然后倒入压样机钢环模具中,在30 t压力下,采用粉末压片制样法压制成型。用X射线荧光光谱法测定锶铁氧体半成品中铁、锶、硅的含量。经试验验证压片时样品与黏合剂淀粉的最佳质量比为5比1。此法用于锶铁氧体半成品样品分析,3种元素的相对标准偏差(n=11)分别为0.06%,0.14%,0.70%,测定值与常规方法测定值相一致。Abstract: Sample for XRFS analysis was prepared by grinding the semi-finished strontium ferrite sample with starch in an agate mortar, and pressing the mixture in the sample moulder under a pressure of 30 t. The contents of Fe, Sr and Si were determined by XRFS. The optimum mass ratio of sample to starch was found to be 5 to 1. The proposed method was used in the analysis of samples of semi-finished product of strontium ferrite, values of RSD′s (n=11) found for the above 3 elements were 0.06%, 0.14%, 0.70% respectively. The results obtained were in consistency with those obtained by the conventional methods.