X射线荧光光谱法分析IC10合金成分
XRFS Analysis for Composition of IC10 Alloy
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摘要: 提出了X射线荧光光谱法测定IC10合金的主量元素及控制限元素含量的方法.采用虚拟定值法对限量元素进行定值,用基本参数法(单点标准比较法)对主量元素进行定值.结果表明:主量元素的相对标准偏差(n=11)均小于0.35%;控制限元素的相对标准偏差均小于2.0%.Abstract: A method of XRFS for determination of major elements and elements of control contents in IC10 alloy was proposed.The elements of control contents were determined by virtual valuation method;and the major elements were determined by the basic parameter method (i.e.the single-point comparative standard).It was found that values of RSD′s (n=11) of major elements and elements of control contents were less than 0.35% and 2.0%,respectively.