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    氢化物发生-等离子发射光谱法同时测定电子五金元件中汞铅镉铬

    HG-ICP-AES DETERMINATION OF MERCURY LEAD CADMIUM AND CHROMIUM IN ELECTRONIC HARDWARE COMPONENTS

    • 摘要: 电子五金元件样品经酸消解后,样品溶液与氯化亚锡经自制简易氢化物装置混合产生氢化物,与样品溶液一起导入等离子体中,可同时测定汞、铅、镉、铬四元素.氢化物发生大大提高了汞的检测灵敏度,汞、铅、镉、铬检出限分别为0.002,0.006,0.002和0.005 mg·L-1,相对标准偏差为2.09%-3.12%.

       

      Abstract: Samples of electronic hardware components were digested with nitric acid,and the sample solutions obtained were mixed with stannous chloride to perform the hydride generation in the self-made,simple hydride generator.The generated hydrides together with the sample solution were then introduced into the ICP,and Hg,Pb,Cd and Cr were determined simultaneously by AES.Sensitivity of detection of mercury was improved remarkably by the use of hydride generation.Values of detection limits of the elements mentioned above were as follows:0.002 mg·L-1 (for Hg),0.006 mg·L-1 (for Pb),0.002 mg·L-1 (for Cd) and 0.005 mg·L-1 (for Cr).RSD′s of analytical results were found in the range of 2.09%-3.12%.

       

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