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    离子交换分离石墨炉原子吸收光谱法测定高纯铟中痕量铊

    GF-AAS Determination of Trace Amounts of Thallium in Fligh-purity Indium After Ion-exchange Separation

    • 摘要: 用硝酸溶解高纯铟样品,阳离子交换树脂分离痕量铊,用石墨炉原子吸收光谱法测定高纯铟中痕量铊.样品中痕量砷、铝、铁、锡与大量的铟被分离,0.4 μg的铜,0.5 μg的锌、镉、镁、银、镍,1.0 μg的铅、硅对0.2 ng铊测定无影响.方法检出限为6 pg,加标回收率为94%~108%.

       

      Abstract: Trace amount of thallium in high-purity indium was separated from the matrix by cation exchange and determined by GF-AAS.The indium sample was dissolved in nitric acid.The strongly acidic cation exchange resin of model 732 was used in the separation.It was shown by experiment,that macro amounts of indium,together with traces of ions of As,Al,Fe and Sn were separated from thallium(Ⅲ);1.0 μg of Pb,Si,0.5 μg of Zn,Cd,Mg,Ag,Ni and 0.4 μg Cu,were found to be not interfering with the determination of 0.2 ng thallium.Detection limit of the method obtained was 6 pg.Test for recovery was made by standard addition method and values of recovery were in the range from 94% to 108%.

       

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