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    气相色谱法测定四氯化硅的纯度

    GC Determination of Purity of Silicon Tetrachloride

    • 摘要: 提出了气相色谱法测定四氯化硅的纯度。采用LD-SE-54(0.53 mm×30 m,1.2 μm)石英毛细管色谱柱分离,热导检测器检测,面积归一化法定量。方法用于分析四氯化硅标准样品,测定值与标准值的相对误差为0.18%,相对标准偏差(n=5)为0.12%。

       

      Abstract: A method of GC for the determination of purity of silicon tetrachloride was proposed. Sample was separated on LD-SE-54 quartz capillary column (0.53 mm×30 m, 1.2 μm)and determined with thermo-conductivity detector (TCD). The quantification was carried out by the method of normalization. The proposed method was used in the analysis of a standard sample of silicon tetrachloride, the relative error between the result obtained and the certified value was found to be 0.18%, and values of RSD (n=5) found was 0.12%.

       

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