Abstract: A method for the determination of 15 impurity elements including B, W, Si, Fe, Pb, Sn, As, Ni, Cr, Co, Cu, P, Mn, Mg and Mo, in V-Al alloy by ICP-AES was proposed. The spectral interferences were corrected by selection of analytical spectral lines and background correction positions; and matrix interferences were eliminated by the use of matrix-matching and synchronous background correction. Values of detection limit (3s) of the method and of background equivalent concentration were found in ranges of 5.0-100 μg·L-1 and 5-95 μg·L-1 respectively. The proposed method was applied to the analysis of samples of V-Al alloys, and the results obtained were in consistency with those obtained by GfE Company. Values of recovery of the method were found in the range of 95.3%-110%, and values of RSD′s (n=8) were found <5.0% (w≥0.010%) and <9.0% (w=0.001%~0.010%).