Determination of Correction Coefficients of Spectral Overlap in XRFS

It was shown that for determination of correction coefficients of spectral overlap (K), the method using sets of standard samples(Ⅰ) and the method of fundamental parameters (FP, Ⅱ) were suitable to be used. In applying method Ⅰ, standard samples with same matrix and similar components of testing samples should be chosen, and spectral overlap often led to negative intercept in the calibration curve. To obtain true values of K and M, several times of iterative calculations were applied to eliminate the intercept and to make the calibration curve passing through the origin. Instances were encountered where method Ⅰ was not applicable. For examples, determination of values of K for elimination the interference of spectral overlap of Cr by V in determination of low contents of chromium in steels. In this case, besides the interference of overlap by V, interference due to the pathway material of the instrument was happened, and it was necessary to eliminate it first, and the correction by applying Rayleigh scattering was performed. Then the value of K was measured and calculated by the FP method using steel standard samples. The interference of spectral overlap of Cr by V was eliminated.