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    REN Lingling. ICP-AES Determination of Trace Elements in Titanium Dioxide[J]. PHYSICAL TESTING AND CHEMICAL ANALYSIS PART B:CHEMICAL ANALYSIS, 2017, 53(7): 796-799. DOI: 10.11973/lhjy-hx201707010
    Citation: REN Lingling. ICP-AES Determination of Trace Elements in Titanium Dioxide[J]. PHYSICAL TESTING AND CHEMICAL ANALYSIS PART B:CHEMICAL ANALYSIS, 2017, 53(7): 796-799. DOI: 10.11973/lhjy-hx201707010

    ICP-AES Determination of Trace Elements in Titanium Dioxide

    • ICP-AES was applied to the determination of trace elements (Si, Al, W, Sb, Fe, Cr, Zr, Nb) in titanium dioxide. The sample (0.200 0 g) was dissolved in 5 mL of HNO3 and 1 mL of HF below 70℃, and the solution was made up its volume to 100 mL with water for use as sample solution. The sample solution was used for ICP-AES determination of 8 trace elements. Analytical spectral lines were selected, and the standard addition method was used to correct the matrix effect in preparation of working curves. Values of detection limits (3s) found for 8 elements were in the range of 0.000 1%-0.008 0%, and values of RSDs (n=8) were all less than 1.7%. Test for recovery for Sb, Fe, Cr, Zr and Nb was made by standard addition method, giving results in the range of 90.0%-105%. The elements of Si, Al, W in samples were analyzed by the proposed method, giving results in consistency with those by chemical method.
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