Determination of Tungsten in Alloys by X-Ray Fluorescence Spectrometry

XRFS was applied to the determination of tungsten in various tungsten containing alloy stees, Ni-based and Co-based alloys. The spectral line of L_β1 of W was chosen as analytical spectral line, and 2θ of 39.50° was selected as background site. Spectral line of L_β2 of Ta was found to interfere with the line of L_β1 of W. Two sets of standard samples were selected and fundamental parameter (FP) method was used with help of FP software to find out the overlap-interfering coefficient k, which was listed in FP software to eliminate the overlap-interference from Ta to W.5 standard samples with W content ranging from 0.054% to 11.71%, were analyzed by the proposed method, giving results in consistency with the certified values, and RSDs (n=7) ranged from 0.55% to 9.5%.