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    LI Haolin, WANG Yu, YANG Hui, LI Wenbiao, LI Jingchuan. Determination of Trace Cerium in Nuclear Grade 316 Stainless Steel by Inductively Coupled Plasma Atomic Emission Spectrometry[J]. PHYSICAL TESTING AND CHEMICAL ANALYSIS PART B:CHEMICAL ANALYSIS, 2024, 60(5): 477-480. DOI: 10.11973/lhjy-hx220523
    Citation: LI Haolin, WANG Yu, YANG Hui, LI Wenbiao, LI Jingchuan. Determination of Trace Cerium in Nuclear Grade 316 Stainless Steel by Inductively Coupled Plasma Atomic Emission Spectrometry[J]. PHYSICAL TESTING AND CHEMICAL ANALYSIS PART B:CHEMICAL ANALYSIS, 2024, 60(5): 477-480. DOI: 10.11973/lhjy-hx220523

    Determination of Trace Cerium in Nuclear Grade 316 Stainless Steel by Inductively Coupled Plasma Atomic Emission Spectrometry

    • A method for the determination of trace cerium in nuclear grade 316 stainless steel by inductively coupled plasma atomic emission spectrometry (ICP-AES) was proposed. 0. 100 0 g of the sample was taken into the beaker, and 15 mL of mixed acid solution consisted of nitric acid-hydrochloric acid-water at volume ratio of 1∶3∶4 was added. The mixture was digested on the 150 ℃ electric heating plate for 30 min. After the sample was completely dissolved, 5 mL of 30% (mass fraction) hydrogen peroxide solution was added, and the mixture was kept constant temperature for 3 min, and then cooled to room temperature. The sample solution was made up to 100 mL by water. The response intensity of cerium at 404. 076 nm of analysis spectral lines was measured with the radio frequency power of the instrument of 1 150 W and the atomizing gas flow of 0. 45 L · min-1, and the matrix matching method was used for quantification. It was shown that linear relationship between mass concentration and response intensity was kept within 100 mg · L-1, with detection limit (3s) of 0. 000 4%. RSDs (n=10) of the determined values of test of four samples for precision were less than 5. 0%. Test for recovery was made according to the standard addition method, giving results in the range of 95. 5%-103%. GH56 (chip sample) iron-nickel based standard substance was used for accuracy verification, and the determined values were basically consistent with the certified values.
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