Advanced Search
    HAN Wei, DING Jian-jun, MEI Yi-fei, MA Zhen-zhu. XRFS Determination of 11 Elements in Gypsum[J]. PHYSICAL TESTING AND CHEMICAL ANALYSIS PART B:CHEMICAL ANALYSIS, 2015, 51(2): 188-191.
    Citation: HAN Wei, DING Jian-jun, MEI Yi-fei, MA Zhen-zhu. XRFS Determination of 11 Elements in Gypsum[J]. PHYSICAL TESTING AND CHEMICAL ANALYSIS PART B:CHEMICAL ANALYSIS, 2015, 51(2): 188-191.

    XRFS Determination of 11 Elements in Gypsum

    • XRFS was applied to determine the concentration of 11 elements,i.e. Na,Mg,Al,Si,S,K,Ca,Ti,Mn,Fe and Sr in gypsum. The sample was grinded for 30 s and squashed into disc shaped to be used for XRFS analysis. Calibration curve was prepared with 8 CRM′s of GBW 03109,GBW 03110,GBW 03111,GBW 03109a,GBW 03111a,GSB 08-1352-2001,GSB 08-1352-2006 and GSB 08-1352-2009. The mathematical models of matrix correction of the 11 elements were optimized. Detection limits of the 11 elements were found in the range of 0.001 4%-0.27%. Values of RSD′s (n=10) were found to be in the range of 0.51%-4.0% by analysis of a sample of gypsum. The proposed method was used in analyzing 3 samples of gypsum,giving results in consistency with those obtained by the GB method.
    • loading

    Catalog

      Turn off MathJax
      Article Contents

      /

      DownLoad:  Full-Size Img  PowerPoint
      Return
      Return