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    CHENG Yong. ICP-AES Determination of Trace Amounts of Vanadium in Nano-Titanium Dioxide and Other Titanium-Base Materials[J]. PHYSICAL TESTING AND CHEMICAL ANALYSIS PART B:CHEMICAL ANALYSIS, 2007, 43(2): 111-113.
    Citation: CHENG Yong. ICP-AES Determination of Trace Amounts of Vanadium in Nano-Titanium Dioxide and Other Titanium-Base Materials[J]. PHYSICAL TESTING AND CHEMICAL ANALYSIS PART B:CHEMICAL ANALYSIS, 2007, 43(2): 111-113.

    ICP-AES Determination of Trace Amounts of Vanadium in Nano-Titanium Dioxide and Other Titanium-Base Materials

    • Optimum condition for the ICP-AES determination of trace amounts of vanadium in samples with titanium as matrix element,e.g.,titanium dioxide,rutile and etc.,was studied.It was found that by choosing wavelength 310.023 nm as the analytical spectral line,the serious interference of titanium(Ⅳ) was avoided.By applying the synchronous backgroud correction,interferences of Ti(Ⅳ) and other commonly encountered ions were effectively eliminated.And also no matrix matching was necessary in the preparation of working curve of vanadium.The sample was digested with HCl-HF-H2SO4 acid mixture and fumed with H2SO4 to expel HF,and finally made up to a definite volume with HCl (5+95).Vanadium content in the range from (w) 2×10-4% to 5% was determined by the proposed method without any procedure of enrichment or separation.Test for precision with samples of different vanadium contents (0.01%-0.20%) gave RSD′s (n=8) less than 3%.Detection limit of this method was found to be 0.01 mg·L-1.Recoveries found were in the range of 99%-106%.
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