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    TONG Yu-gui, CHENG Qun, LIN Bi-fen, ZHENG Zhi-ming. HG-ICP-AES DETERMINATION OF MERCURY LEAD CADMIUM AND CHROMIUM IN ELECTRONIC HARDWARE COMPONENTS[J]. PHYSICAL TESTING AND CHEMICAL ANALYSIS PART B:CHEMICAL ANALYSIS, 2006, 42(10): 841-842.
    Citation: TONG Yu-gui, CHENG Qun, LIN Bi-fen, ZHENG Zhi-ming. HG-ICP-AES DETERMINATION OF MERCURY LEAD CADMIUM AND CHROMIUM IN ELECTRONIC HARDWARE COMPONENTS[J]. PHYSICAL TESTING AND CHEMICAL ANALYSIS PART B:CHEMICAL ANALYSIS, 2006, 42(10): 841-842.

    HG-ICP-AES DETERMINATION OF MERCURY LEAD CADMIUM AND CHROMIUM IN ELECTRONIC HARDWARE COMPONENTS

    • Samples of electronic hardware components were digested with nitric acid,and the sample solutions obtained were mixed with stannous chloride to perform the hydride generation in the self-made,simple hydride generator.The generated hydrides together with the sample solution were then introduced into the ICP,and Hg,Pb,Cd and Cr were determined simultaneously by AES.Sensitivity of detection of mercury was improved remarkably by the use of hydride generation.Values of detection limits of the elements mentioned above were as follows:0.002 mg·L-1 (for Hg),0.006 mg·L-1 (for Pb),0.002 mg·L-1 (for Cd) and 0.005 mg·L-1 (for Cr).RSD′s of analytical results were found in the range of 2.09%-3.12%.
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