ICP-AES Determination of Silicon and Phosphorus in Ferroaluminum Manganese Alloy
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Graphical Abstract
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Abstract
ICP-AES was used to determine silicon and phosphorous in ferroaluminun manganese alloy. Wavelengths of 178.242 nm and 251.611 nm were used as the analytic lines for silicon and phosphorous, which could eliminate overlapping interference of spectral line. The physical interferences were eliminated by using standard sample similar to the matrixes of the analytes at the same experimental conditions. Meanwhile, the effects of the acid or basic solvents were compared. The method was used in the determination of silicon and phosphorous in ferroaluminum manganese alloy. The RSD (n=6) of controlled trials was not more than 7.0%.
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