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    CHENG Yong. ICP MS Determination of 15 Impurity Elements in High Purity Vanadium Pentoxide with Microwave Assisted Sample Digestion[J]. PHYSICAL TESTING AND CHEMICAL ANALYSIS PART B:CHEMICAL ANALYSIS, 2014, 50(6): 745-748.
    Citation: CHENG Yong. ICP MS Determination of 15 Impurity Elements in High Purity Vanadium Pentoxide with Microwave Assisted Sample Digestion[J]. PHYSICAL TESTING AND CHEMICAL ANALYSIS PART B:CHEMICAL ANALYSIS, 2014, 50(6): 745-748.

    ICP MS Determination of 15 Impurity Elements in High Purity Vanadium Pentoxide with Microwave Assisted Sample Digestion

    • The sample of vanadium pentoxide was treated with a mixture of HNO3 and HF (4+1) by microwave assisted digestion, and contents of 15 impurity elements ( i.e. Ti, Si, Al, Cr, Ni, Cu, Pb, As, P, Fe, Mn, Ca, Mg, K and Na ) in the sample solution were determined by ICPMS. The matrix interference was eliminated by internal standard method. Detection limits (3s/k) of the method found were in the range of 0.03-0.89 μg·L-1. Tests for recovery were made by standard addition method, giving values of recovery in the range of 90.0%-113% and RSD′s (n=8) found were less than 5.0%. Contents of 8 impurity elements in sample 5# were checked by GFAAS method, consistent values were obtained.
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