Characterization of Silver Layer Deposited by Carbon Dioxide Laser Induction

Testing methods including scanning electron microscopy (SEM),electron probe microanalysis (EPMA),atomic force microscopy (AFM) and X-ray photoelectron spectroscopy (XPS),were used in the characterization of the silver layer deposited locally by CO2-laser induction.As shown by experimental results,the deposited silver layer was distributed just like “isolated islands” on the surface of the substrate of epoxy resin glass fibre board,and showed no macro-conductivity.Strong adhesion of the silver layer to the substrate was obtained due to its partial diffusion into the substrate,and behaved as a transitional layer between the copper layer and the substrate in further chemical plating of copper.It was also verified experimentally that silver in the deposited layer was present as simple substance,occluded with impurities of oxygen,nitrogen and carbon.