XRFS Determinate of Silicon Dioxide in Organic Coating of Fingerprint Proof Board

XRFS was applied to the determination of SiO2 in organic coating of fingerprint proof board.The empirical coefficient method was used for correction in the XRFS analysis under the prerequisite of same composition of the base board material and same category of the organic coating material in both the standard sample and the testing sample.The proposed method was applied to the analysis of a known sample of fingerprint proof board (with known SiO2 content of 76.65 mg·m-2),giving results of average SiO2 content 76.66 mg·m-2 and value of RSD (n=12) 0.087%.